Description:
The Central Analytical Facility is equipped
with a Hatachi 8000 - 200 kV Transmission Electron
Microscope. The TEM has scanning capabilities for STEM work.
It is also equipped with a NORAN Energy Dispersive Spectrometer (EDS) for
X-ray analysis, and has a secondary electron detector for imaging.
X-ray signals can also be used for X-ray mapping.
