Description:
The Central Analytical Facility has a Philips XL 30
Scanning Electron Microscope. The SEM is equipped with an Energy
Dispersive Spectrometer (EDS) and has both back-scattered electron and
secondary electron detectors for imaging. The stage is
non-motorized. The SEM is operated
through a PC based system. Most independent CAF users are expected
to be proficient in use of this instrument.
Both theory and operation of the SEM are
given in MTE 691. (Dr. Viola Acoff, Metallurgical Engineering)
Both theory and operation of the microprobe and SEM are
given in Geology 577 -- Microanalysis.
Instructional Downloads:
(PP Files)
Tutorial 1 - XL30 Control Pgm
Tutorial 2
- Operation
Tutorial 3 - X-ray Analysis
How to
Transfer Data
