Instrumentation:
(Click link for instrumentation and
laboratory description)
ATOM PROBE:
IMAGO LEAP
SCANNING ELECTRON MICROSCOPES:
JEOL-7000 Scanning
Electron Microscope
Philips XL-30 Scanning Electron Microscope
Hitachi S-900 Scanning Electron Microscope
FOCUSED ION BEAM:
FEI Quanta 3D Dual
Beam
TRANSMISSION ELECTRON MICROSCOPES:
Hitachi H-8000
Transmission Electron Microscope
FEI Technai TF-20 Transmission Electron
Microscope
ELECTRON MICROPROBE:
JEOL-8600 Microprobe
ESCA (XPS) - AUGER ANALYSIS:
Kratos Axis 165 XPS/Auger
PREPARATION FACILITIES:
Coating, Milling,
and other non-wet
Wet preparation
facility (TEM)
